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How to Look Away

On American Cruelty and the Refusal to Disappear

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Sinopsis

A riveting, kaleidoscopic portrait of the American compulsion toward cruelty and our power to subvert it from an award-winning contributor to The Guardian and The New York Times.

In How to Look Away, Daniel Peña explores how fringe elements of his Texas childhood—AM radio, conspiracy theories, Post-Cold War paranoia—came to dominate the American political discourse and contributed to our extreme tolerance of human rights abuses against migrants from Latin America and elsewhere. He asks: What compels us to look away from these abuses? And how do we wake ourselves into action?

These evocative essays braid journalism, cultural criticism, and memoir, roaming from the vestigial Comanche War battlefields of his native Austin, to the black markets of Mexico City, to the home of a cartel hitman’s family doomed to live in the unglamorous aftermath of his crimes. Writing from both Mexico and the United States, Daniel Peña reflects on two childhood fears: demons and the death penalty. Or the answer to the question, “Do you ever really belong to yourself?” A question that serves as the looking glass through which Peña meditates on American citizenship and the kinds of people we are willing to disappear in the name of the American project.

How to Look Away conjures disquiet and longing beside clarity and hope as it offers a haunting account of the strange bond between two nations, this American moment, and the land upon which our bodies stand.
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Ficha Técnica

Editorial: One World

ISBN: 9780593596401

Idioma: Inglés

Fecha de lanzamiento: 06/10/2026

Especificaciones del producto

Escrito por Daniel Peña

Daniel Peña es catedrático de Estadística en la Universidad Carlos III de Madrid, de la que es rector desde 2007, y ha sido catedrático en las Universidades Politécnica de Madrid, Wisconsin-Madison y Chicago. Es miembro electo del International Statistical Institute y Fellow del Institute of Mathematical Statistics y The American Statistical Association. Del mismo autor Alianza Editorial ha publicado también Fundamentos de Estadística y Regresión y diseño de experimentos.
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